探头前沿测量检测标准探头前沿测量-中析研究所检测

(CMA)

(CNAS)

(ISO)

(高新技术企业)

探头前沿测量相关标准参考信息

GB/T 18852-2020 无损检测超声检测测量接触探头声束特性的参考试块和方法
简介：
信息：ICS：19.100 CCS：J04 发布：2020-11-19 00:00:00.0 实施：2021-06-01 00:00:00.0

DIN EN 61010-031-2008 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持探头组件的安全要求
简介：
信息：ICS：13.260;17.220.20 CCS：N20 发布：2008-08 实施：2008-08-01

KS C 1010-2-31-2000(2020) 测量、控制和实验室用电气设备的安全要求第2－31部分:手持式探头组件电气测量和试验的特殊要求
简介：
信息：ICS： CCS：发布：2000-04-15 实施：

GB/T 35680-2017 液体材料微波频段使用开口同轴探头的电磁参数测量方法
简介：
信息：ICS：17.240 CCS：N05 发布：2017-12-29 00:00:00.0 实施：2018-07-01 00:00:00.0

IEC 61010-031-2002+AMD1-2008 CSV 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2008-06-24 实施：

ASTM B667-1997(2009) 电接触阻力测量用探头的制造和使用的标准实施规程
简介：Electrical contact resistance is an important characteristic of the contact in certain components, such as connectors, switches, slip rings, and relays. Ordinarily, contact resistance is required to be low and stable for proper functioning of many devices or apparatus in which the component is used. It is more convenient to determine contact resistance with a probe than to incorporate the contact material into an actual component for the purpose of measurement. However, if the probe contact material is different from that employed in the component, the results obtained may not be applicable to the device. Information on contact resistance is useful in materials development, in failure analysis studies, in the manufacturing and quality control of contact devices, and in research. Contact resistance is not a unique single-valued property of a material. It is affected by the mechanical conditions of the contact, the geometry and roughness of contacting surfaces, surface cleanliness, and contact history, as well as by the material properties of hardness and conductivity of both contacting members. An objective of this practice is to define and control many of the known variables in such a way that valid comparisons of the contact properties of materials can be made. In some techniques for measuring contact resistance it is not possible to eliminate bulk resistance, that is, the resistance of the metal pieces comprising the contact and the resistance of the wires and connections used to introduce the test current into the samples. In these cases, the measurement is actually of an overall resistance, which is often confused with contact resistance.1.1 This practice describes equipment and techniques for measuring electrical contact resistance with a probe and the presentation of results. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices, and determine the applicability of regulatory limitations prior to use.
信息：ICS：17.220.20 (Measurement of electrical and magnetic CCS：N25 发布：1997 实施：

GB 4793.5-2008 测量、控制和实验室用电气设备的安全要求第5部分：电工测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：N09 发布：2008-08-30 实施：2009-09-01

IEC 61010-031:2002+AMD1:2008 CSV 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2008-06-24 实施：

ASTM E1813-1996(2002) 扫描探测显微镜探头测量和报告的标准实施规程
简介：1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.1.2 This practice also describes a method for measuring the shape and size of a probe tip to be used in scanning probe microscopy. The method employs special sample shapes, known as probe characterizes, which can be scanned with a probe microscope to determine the dimensions of the probe. Mathematical techniques to extract the probe shape from the scans of the characterizes have been published (2-5). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
信息：ICS：19.100 (Non-destructive testing) CCS：N04 发布：1996 实施：

GB4793.5-2008 测量、控制和实验室用电气设备的安全要求第5部分：电工测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：N09 发布：2008-08-30 实施：2009-09-01

IEC 60512-16-1:2008 电子设备连接器 - 测试和测量 - 第16-1部分:触点和端子的机械测试 - 测试16a:探头损坏
简介：
信息：ICS：31.220.10 CCS：发布：2008-06-11 实施：

ASTM E1813-1996(2007) 扫描探测显微镜探头测量和报告的标准实施规程
简介：The shape and orientation of the probe tip determines which information can be reliably extracted from a scan. This applies to all types of scans. For instance, in surface roughness measurement, the probe tip radius has a profound effect on the spatial frequencies that the probe can reliably measure. Consequently, in reporting data from a probe microscope, it is important to obtain and include in the report information about the shape of the probe tip.1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.1.2 This practice also describes a method for measuring the shape and size of a probe tip to be used in scanning probe microscopy. The method employs special sample shapes, known as probe characterizers, which can be scanned with a probe microscope to determine the dimensions of the probe. Mathematical techniques to extract the probe shape from the scans of the characterizers have been published (2-5). This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
信息：ICS：19.100 (Non-destructive testing) CCS：N04 发布：1996 实施：

GB 4793.5-2008 测量、控制和实验室用电气设备的安全要求.第5部分:电工测量和试验用手持探头组件的安全要求
简介：GB 4793的本部分适用于下述各类型的手持和手操探头组件，以及专业用、工业过程用、教育用相关附件。这些探头组件用来作为一种电气现象与试验或测量设备之间的接口。它们可以被固定地安装在设备上，也可以是设备的可拆卸附件。a）低压和高压非衰减探头组件（A型）：非衰减探头组件直接接入的额定电压值高于交流33V有效值、46.7V峰值或直流70V，但不超过63kV。它们既不包含有源元件，也不具备分压功能或信号调节功能，但可能包括熔断器之类的无源非衰减元件。b）高压衰减或分压探头组件（B型）：衰减或分压式探头组件直接接入的二次电压的额定值高于1kv，但不超过63kV。分压功能可以全部在探头组件内实现，或在与本探头组件一同使用的试验或测量设备中部分地实现。c）低压衰减或分压探头组件（C 型）：衰减、分压或其他信号调节探头组件直接接入的电压额定值高于交流33V，有效值、46.7V峰值或直流70V，但不超过1kV交流有效值或1.5kV直流值。信号调节功能可以全部在探头组件内实现，或在与本探头组件一同使用的试验或测量设备中部分地实现。
信息：ICS：19.080 CCS：K60;N09 发布：2008-08-30 实施：2009-09-01

IEC 61010-031 Edition 1.1-2008 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：N20 发布：2008-06 实施：

ASTM E1813-1996e1 扫描探测显微镜探头测量和报告的标准实施规程
简介：1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.1.2 This practice also describes a method for measuring the shape and size of a probe tip to be used in scanning probe microscopy. The method employs special sample shapes, known as probe characterizers, which can be scanned with a probe microscope to determine the dimensions of the probe. Mathematical techniques to extract the probe shape from the scans of the characterizers have been published (2-5). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
信息：ICS： CCS：N04 发布：1996 实施：

GB/T 18852-2002 无损检测超声检验测量接触探头声束特性的参考试块和方法
简介：本标准推荐两种金属参考试块，半圆阶梯试块（HS试块）和横孔试块（SDH试块）。本标准为接触探伤中使用的探头在固体内产生的声场提供了测定方法。测定的探头包括直探头、斜探头（折射纵波和折射横波），聚焦探头和双晶探头。探头的直径或边长不大于25mm，本标准适用于检测锻钢或轧制钢、铝合金或钛合金产品的探头测定。本标准适用的探头频率范围为1MHz至15MHz。1MHz至5MHz最适宜于对钢铁产品的检测，5MHz至15MHz最适宜于对象铝合金之类的细晶粒结构产品的检测。如将本标准用于钢以外的产品检测，用户须知，其产品内的声速与钢中声速不同，而斜探头通常是按应用于钢来设计的。本标准给出的Snell定律是让用户计算其他材料内准确折射角用的。本标准适用于所有实用折射角范围（0°～70°）。也适用于聚焦探头和双晶探头。本标准不适用于表面波探头。本标准给出的方法可以被整体采纳，也可以在同其他标准合用时部分采纳。当检测更厚或更薄的材料时也可以将本标准推荐试块（HS和SDH试块）相应增大或减小。本标准没有考虑对需要使用平底孔试块来测定的缺陷当量尺寸作出评估。本标准没有验收标准，当然，本标准已为用户制定验收标准奠定了技术基础。
信息：ICS：19.100 CCS：J04 发布：2002-10-11 实施：2003-05-01

IEC 61010-031-2002/AMD1-2008 修改件1.测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2008-02-12 实施：

IEC 61266:1994 超声波 - 手持探头多普勒胎心跳探测器 - 性能要求和测量和报告方法
简介：
信息：ICS：17.140.50 CCS：发布：1994-12-15 实施：

GB 4793.5-2001 测量、控制及实验室用电气设备的安全电工测量和试验用手持探头的特殊要求
简介：本标准适用于下述各型式手持和手操作的探头组件及有关附件。这些探头组件用来作为一种电量和一个测量和试验设备之间的接口。它们可能是IEC 61010-1范围中规定的独立应用的探头组件，也可能是IEC 61010-1范围中规定的其他设备的附件。 A）低压和高压、非衰减探头组件（A型） b）高压衰减或分压探头组件（B型） c）低压衰减或分压探头组件（C型）
信息：ICS：19.080 CCS：N09 发布：2001-11-02 实施：2002-06-01

IEC 61010-031:2002/AMD1:2008 修改件1.测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2008-02-12 实施：

JIS Z2350-1992 超声探头性能特征测量方法
简介：
信息：ICS：19.100 CCS：H26 发布：1992-03-01 实施：

JIS T1506-2018 手持式超声波探头多普勒胎儿心跳探测仪.性能要求、测量和报告方法
简介：
信息：ICS：11.040.55;17.140.50 CCS：C41 发布：2018-10-01 实施：

IEC 61010-031 AMD 1-2008 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求.修改件1
简介：This standard is about Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test; Amendment 1
信息：ICS：19.080 CCS：N20 发布：2008-02 实施：

ASTM F672-1988(1995)e1 用分布电阻探头测量硅晶片垂直于表面的纵断面电阻率的标准试验方法
简介：1.1 This test method covers measurement of the resistivity profile perpendicular to the surface of a silicon wafer of known orientation and type. Note 1--This test method may also be applicable to other semiconductor materials, but feasibility and precision have been evaluated only for silicon and germanium.1.2 This test method may be used on epitaxial films, substrates, diffused layers, or ion-implanted layers, or any combination of these.1.3 This test method is comparative in that the resistivity profile of an unknown specimen is determined by comparing its measured spreading resistance value with those of calibration standards of known resistivity. These calibration standards must have the same surface preparation, conductivity type, and crystallographic orientation as the unknown specimen.1.4 This test method is intended for use on silicon wafers in any resistivity range for which there exist suitable standards. Polished, lapped, or ground surfaces may be used.1.5 This test method is destructive in that the specimen must be beveled.1.6 Correction factors, which take into account the effects of boundaries or local resistivity variations with depth, are needed prior to using calibration data to calculate resistivity from the spreading resistance values. Note 2--This test method extends Method F525 to depth profiling.Note 3--This test method provides means for directly determining the resistivity profile of a silicon specimen normal to the specimen surface. Unlike Test Methods F84, F374, F1392, and F1393, it can provide lateral spatial resolution of resistivity on the order of a few micrometres, and an in-depth spatial resolution on the order of 10 nm (100 A). This test method can be used to profile through p-n junctions.1.7 This test method is primarily a measurement for determining the resistivity profile in a silicon wafer. However, common practice is to convert the resistivity profile information to a density profile. For such purposes, a conversion between resistivity and majority carrier density is provided in Appendix X2.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 9.
信息：ICS：29.045 (Semiconducting materials) CCS：H82 发布：1988 实施：

IEC 61010-031 AMD 1-2018 测量、控制和实验室用电气设备的安全要求.第031部分:电气试验和测量用手持式和手操纵探头组件的安全要求.修改件1
简介：
信息：ICS：19.080 CCS：N20 发布：2018-0501 实施：

YD/T 1690.6-2007 电信设备内部电磁发射诊断技术要求和测量方法（150kHz～1GHz）第6部分：传导发射测量磁场探头方法
简介：本部分规定了用微型磁场探头以非接触的电流测量方式来测量集成电路(IC)的管脚的射频电流的方法。本方法可以在150 kHz～1GHz频率范围内测量由IC产生的射频电流本部分适用于单个IC的测量或者用于标准测试板上的IC：芯片组的描述和比较
信息：ICS：33.100 CCS：L06 发布：2007-09-29 实施：2008-01-01

DIN EN 61010-031/A1-2017 测量、控制和实验室用电气设备的安全要求. 第031部分：电气试验和测量用手持式和手持式探头组件的安全要求(IEC 23J/432/CDV:2017)；德文版本EN 61010-031:2015/prA1:2017
简介：This part of IEC 61010 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and related accessories. These probe assemblies are for use in the interface between an electrical phenomenon and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment.
信息：ICS：19.080 CCS：发布：实施：

DIN EN 61010-031 Berichtigung 1-2017 测量, 控制和实验室使用电气设备的安全要求. 第031部分: 电气测量和试验用手持探头组件的安全要求(IEC 61010-031-2015); 德文版本EN 61010-031-2015, 勘误表
简介：
信息：ICS：19.080 CCS：N20 发布：2017-04 实施：

UL 61010-031-2007 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求
简介：The document specifies safety requirements for probe assemblies for (electrical) measurement and test. It applies to hand-held and hand-manipulated probe assemblies of the types described below, and related accessories which are intended for professional, industrial process, and educational use. These probe assemblies are for use in the interface between an electrical phenomenon and test or measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment. a) Low-voltage and high-voltage, non-attenuating probe assemblies (type A). Non-attenuating probe assemblies that are rated for direct connection to voltages exceeding 33 V r.m.s. or 46,7 V peak or 70 V d.c., but not exceeding 63 kV. They do not incorporate active components, nor are they intended to provide a voltage divider function or a signal conditioning function, but they may contain passive non-attenuating components such as fuses. b) High-voltage attenuating or divider probe assemblies (type B). Attenuating or divider probe assemblies that are rated for direct connection to secondary voltages exceeding 1 kV but not exceeding 63 kV. The divider function may be carried out wholly within the probe assemblies, or partly within the test or measurement equipment to be used with the probe assemblies. c) Low-voltage attenuating or divider probe assemblies (type C). Attenuating, divider or other signal conditioning probe assemblies for direct connection to voltages exceeding 33 V r.m.s or 46,7 V peak or 70 V d.c., but not exceeding 1 kV r.m.s. or 1,5 kV d.c. The signal conditioning function may be carried out wholly within the probe assemblies, or partly within the test or measurement equipment intended to be used with the probe assemblies. This standard does not cover a) reliable function, performance or other properties of the probe assembly; b) effectiveness of transport packaging; c) servicing (repair); d) protection of servicing (repair) personnel.
信息：ICS：13.260;17.220.20 CCS：K60 发布：2007-03-30 实施：

简介： 信息：

DIN EN 61010-031-2016 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持探头组件的安全要求(IEC 61010-031-2015).德文版本EN 61010-031-2015
简介：
信息：ICS：19.080 CCS：N20 发布：2016-07 实施：

UL 61010-031 (ND)-2007 测量, 控制和实验室用电气设备UL 61010-031安全性要求的国家差异. 第031部分: 电工测量和试验用手持探头组件的安全要求 (第一版; 通过和包括2014年11月7日的修订再版)
简介：
信息：ICS： CCS：K60 发布：2007-03-30 实施：

简介： 信息：

LST EN 61010-031-2015 测量, 控制和实验室用电气设备的安全要求. 第031部分: 电工测量和试验用手持探头组件的安全要求(IEC 61010-031-2015)
简介：
信息：ICS：19.080 CCS：发布：2015-12-16 实施：2015-12-16

CSA C22.2 NO 61010-031-07-CAN/CSA-2007 测量,控制和实验室用电气设备的安全要求.第031部分:电测量和试验用手控探头组件安全要求.第1版
简介：Canadian Standards Association (CSA) standards are developed through a consensus standards development process approved by theStandards Council of Canada. This process brings together volunteers representing varied viewpoints and interests to achieve co
信息：ICS： CCS：K60 发布：2007-03-01 实施：

简介： 信息：

IEC 61010-031:2015 用于测量控制和实验室使用的电气设备的安全要求 - 第031部分:用于电气测量和测试的手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2015-05-29 实施：

ANSI/ISA 61010-031(82.02.02)-2007 测量、控制和实验室用电气设备安全要求.第031部分:电气测量和试验用手持探头组件安全要求
简介：Applies to hand-held and hand-manipulated probe assemblies, and related accessories which are intended for professional, industrial process, and educational use. These probe assemblies are for use in the interface between an electrical phenomenon and test or measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment.
信息：ICS：13.260;17.220.20 CCS：K09 发布：2007 实施：

简介： 信息：

IEC 61010-031-2015 测量、控制和实验室用电气设备的安全要求.第031部分:电气测量和试验用手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：N20 发布：2015-05 实施：

JIS C1010-31-2006 测量、控制、和实验室用电气设备的安全要求.第31部分:电气测量和试验用手提探头组合件的安全要求
简介：この規格は，専門家用，産業プロセス用及び教育用途で.次に示すタイプの手持形及び手で操作するプローブアセンブり，並びに関連附属品について規定する。これらのプローブアセンブリは，電気的現象と試験又は測定機器とのインタフュースに用いるものとする。これらは.機器に固定するか，又は機器に対して着脱可能な附属品であってもよい。
信息：ICS：19.080 CCS：N20 发布：2006-11-20 实施：

简介： 信息：

GOST IEC 61010-031-2013 测量, 控制和实验室用电气设备的安全要求. 第031部分. 电工测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2013 实施：2015-09-01

JIS T1506-2005 手持式超声波探头多普勒胎儿心跳探测仪.性能要求、测量和报告方法
简介：この規格は，単一超音波ビームを発生し，連続波超音波又は準連続波超音波を使用したドプラ法によって母体腹壁から胎児心拍動の情報を得るために使われる，手持の探触子によって構成する装置について適用する。
信息：ICS：11.040.55 CCS：C41 发布：2005-03-25 实施：

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GOST IEC 61010-031-2013 测量, 控制和实验室用电气设备的安全要求. 第031部分. 电工测量和试验用手持探头组件的安全要求
简介：
信息：ICS：19.080 CCS：K30 发布：2013 实施：2015-09-01

SANS 12715-2004 无损检测．超声检验．测量接触探头声束特性的参考试块和方法
简介：Introduces two ultrasonic reference blocks and provides a general methodology of using the blocks in order to establish sound fields or beam profiles in contact tests.
信息：ICS：19.100 CCS：H26 发布：2004-12-10 实施：

简介： 信息：

DIN EN 61967-6 Berichtigung 1-2011 集成电路.150 kHz至1 GHz电磁辐射的测量.第6部分:传导发射测量.磁场探头方法(IEC 61967-6-2002 + A1-2008);德文版本EN 61967-6-2002 + A1-2008,DIN EN 61967-6-200的技术勘误
简介：
信息：ICS：31.200 CCS：L56 发布：2011-02 实施：

UL 61010B-2-031-2003 测量、控制及实验室用电气设备.第2部分:电测量及试验用手持探头组件的特殊要求
简介：Replacement：This International Standard applies to hand--held and hand--manipulated PROBE ASSEMBLIES of the typesdescribed below，and related accessories These PROBE ASSEMBLIES are for use in the interface between anelectrical phenomenon and a measuring or test instrument They may be stand-alone PROBE ASSEMBLIESwhich are themselves within the scope of part 1，or accessories to other equipment within the scope ofpa rtla)Low—voltage and high—voltage，non—attenuating PROBE ASSEMBLIES(type A)Non-attenuating PROBE ASSEMBLIES for direct connection to voltages not exceeding 63 kV r m s ord．c They do not incorporate active components，nor are they intended to provide a voltagedivider function or a signal conditioning function，but they may contain passive non-attenuatingcomponents such as fusesb)High-voltage attenuating or divider PROBE ASSEMBLIES(type B)Attenuating or divider PROBE ASSEMBLIES for direct connection to voltages exceeding 1 kV r m s ord．c but not exceeding 63 kV r m s Or d c The divider function may be carried out wholly withinthe PROBE ASSEMBLY，or partly in the test or measu ring equipment intended to be used with thec)Low-voltage attenuating or divider PROBE ASSEMBLIES(type C)Attenuating，divider or other signal conditioning PROBE ASSEMBLIES for direct connection to voltagesexceeding 30 V rm s or42，4 V peak or 60 V d c，but not exceeding 1 kV r m s，peak or d cThe signal conditioning function may be carried out wholly within the PROBE ASSEMBLY，or partlywithin the test or measuring equipment intended to be used with the PROBE ASSEMBLY
信息：ICS：71.040.20 CCS：N20 发布：2003-06-25 实施：

简介： 信息：

GOST IEC 61010-031-2011 测量、控制和实验室用电气设备的安全性要求.第031部分:电气测量和试验用手提探头组合件的安全性要求
简介：
信息：ICS：19.080 CCS：发布：2011 实施：2013-01-01

ISO/TR 10305-2:2003 道路车辆——电磁场强度测量装置的校准第2部分:9 kHz至40 GHz范围内电磁场传感器和探头（不包括天线）校准的IEEE标准
简介：
信息：ICS：43.180 CCS：发布：2003-02-10 实施：

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ANSI/UL 61010-031-2010 测量,控制和实验室用电气设备安全性要求标准.第031部分:电气测量和试验用手持探头组件安全性要求
简介：Proposed Requirements based on Amendment 1 of IEC 61010-031
信息：ICS：13.260;17.220.20 CCS：K09 发布：2010 实施：

JIS Z2350-2002 超声探头性能特征测量方法
简介：この規格は，公称周波数0.5 MHz以上15 MHz以下の超音波探触子(以下，“探触子”という。)の性能測定方法について規定する。
信息：ICS：19.100 CCS：H26 发布：2002-03-20 实施：

简介： 信息：

DIN EN 61010-031 Berichtigung 1-2009 测量,控制和试验室用电气设备的安全要求.第031部分:电测量及测试用手持式探头组件的安全要求(IEC 61010-031:2002+A1:2008),德文版本EN EN 61010-031:2002 +A1:2008
简介：
信息：ICS：13.260;17.220.20 CCS：N20 发布：2009-10 实施：

IEC 61010-031:2002 用于测量控制和实验室使用的电气设备的安全要求 - 第031部分:用于电气测量和测试的手持式探头组件的安全要求
简介：
信息：ICS：19.080 CCS：发布：2002-01-10 实施：

简介： 信息：